Vyberte rok publikace:
1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 všeRok publikace: 1993
Citace článku | Všechny časopisy | Biologické časopisy | Chemické časopisy | Fyzikální časopisy | Lékařské časopisy | Matematické časopisy | Časopisy Věd o Zemi
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n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit.
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1000x—99999x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x
|
500x—999x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x
|
200x—499x | 1 | 278x | 0 | 0x | 0 | 0x | 1 | 278x | 0 | 0x | 0 | 0x | 0 | 0x
|
100x—199x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x
|
50x—99x | 4 | 331x | 1 | 91x | 0 | 0x | 3 | 240x | 0 | 0x | 0 | 0x | 0 | 0x
|
20x—49x | 11 | 352x | 2 | 53x | 7 | 223x | 2 | 75x | 0 | 0x | 1 | 21x | 0 | 0x
|
10x—19x | 22 | 303x | 6 | 79x | 12 | 164x | 5 | 74x | 1 | 13x | 2 | 25x | 0 | 0x
|
5x—9x | 16 | 101x | 6 | 36x | 8 | 52x | 2 | 14x | 0 | 0x | 1 | 7x | 0 | 0x
|
2x—4x | 18 | 52x | 4 | 11x | 10 | 27x | 5 | 14x | 0 | 0x | 0 | 0x | 2 | 6x
|
1x—1x | 1 | 1x | 1 | 1x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x
|
0x—0x | 6 | 0x | 2 | 0x | 4 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x
|
Celkem | 79 | 1418x | 22 | 271x | 41 | 466x | 18 | 695x | 1 | 13x | 4 | 53x | 2 | 6x |
Fyzikální časopisy
Citace: 10x—19x
- Citováno 18x
OHLIDAL, I. APPROXIMATE FORMULAS FOR THE REFLECTANCE, TRANSMITTANCE, AND SCATTERING LOSSES OF NONABSORBING MULTILAYER SYSTEMS WITH RANDOMLY ROUGH BOUNDARIES. J. Opt. Soc. Am. A-Opt. Image Sci. Vis.. 10, 158-171, 14p, ISSN/eISSN: 1084-7529/1520-8532, (JAN 1993) ,WOS:A1993KF64500017 Citováno: 18x
- Citováno 17x
HOLY, V; KUBENA, J; ABRAMOF, E; PESEK, A; KOPPENSTEINER, E. X-RAY-DIFFRACTOMETRY OF SMALL DEFECTS IN LAYERED SYSTEMS. J. Phys. D-Appl. Phys.. 26, A146-A150, 5p, ISSN/eISSN: 0022-3727/1361-6463, (APR 14 1993) ,WOS:A1993KY84600032 Citováno: 17x
- Citováno 14x
HUMLICEK, J; ROSELER, A. IR ELLIPSOMETRY OF THE HIGHLY ANISOTROPIC MATERIALS ALPHA-SIO2 AND ALPHA-AL2O3. Thin Solid Films. 234, 332-336, 5p, ISSN/eISSN: 0040-6090/, (OCT 25 1993) ,WOS:A1993MD34100006 Citováno: 14x
- Citováno 14x
ZOLLNER, S; GARRIGA, M; KIRCHER, J; HUMLICEK, J; CARDONA, M; NEUHOLD, G. TEMPERATURE-DEPENDENCE OF THE DIELECTRIC FUNCTION AND THE INTERBAND CRITICAL-POINT PARAMETERS OF GAP. Thin Solid Films. 233, 185-188, 4p, ISSN/eISSN: 0040-6090/, (OCT 12 1993) ,WOS:A1993MB36200037 Citováno: 14x
- Citováno 11x
VRESTAL, J; TOMISKA, J. THE COMBINATION OF A SIMPLE MONOPOL MASS-SPECTROMETER WITH A KNUDSEN CELL FOR THERMODYNAMIC INVESTIGATIONS AT HIGH-TEMPERATURES. J. Non-Cryst. Solids. 156, 429-432, 4p, ISSN/eISSN: 0022-3093/1873-4812, (MAY 1993) ,WOS:A1993LC96400094 Citováno: 11x
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