Vyberte rok publikace:
1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 všeRok publikace: 1998
| Citace článku | Všechny časopisy | Multioborové časopisy | Biologické časopisy | Chemické časopisy | Fyzikální časopisy | Lékařské časopisy | Matematické časopisy | Časopisy Věd o Zemi | Ostatní časopisy
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| n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit.
|
| 1000x—99999x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x
|
| 500x—999x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x
|
| 200x—499x | 3 | 917x | 1 | 446x | 1 | 268x | 1 | 268x | 1 | 268x | 1 | 203x | 0 | 0x | 1 | 203x | 0 | 0x
|
| 100x—199x | 3 | 331x | 0 | 0x | 2 | 216x | 1 | 115x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x
|
| 50x—99x | 12 | 793x | 0 | 0x | 3 | 226x | 3 | 219x | 3 | 199x | 3 | 173x | 0 | 0x | 2 | 109x | 0 | 0x
|
| 20x—49x | 31 | 918x | 0 | 0x | 11 | 326x | 17 | 542x | 12 | 361x | 0 | 0x | 2 | 49x | 5 | 145x | 1 | 26x
|
| 10x—19x | 34 | 468x | 0 | 0x | 13 | 183x | 15 | 201x | 9 | 123x | 2 | 29x | 1 | 12x | 0 | 0x | 2 | 27x
|
| 5x—9x | 30 | 210x | 0 | 0x | 8 | 49x | 17 | 117x | 8 | 57x | 2 | 16x | 3 | 23x | 1 | 6x | 0 | 0x
|
| 2x—4x | 30 | 77x | 0 | 0x | 5 | 14x | 15 | 39x | 8 | 22x | 1 | 4x | 6 | 15x | 1 | 2x | 1 | 2x
|
| 1x—1x | 9 | 9x | 0 | 0x | 1 | 1x | 3 | 3x | 2 | 2x | 0 | 0x | 4 | 4x | 0 | 0x | 1 | 1x
|
| 0x—0x | 18 | 0x | 0 | 0x | 2 | 0x | 10 | 0x | 5 | 0x | 0 | 0x | 1 | 0x | 1 | 0x | 0 | 0x
|
| Celkem | 170 | 3723x | 1 | 446x | 46 | 1283x | 82 | 1504x | 48 | 1032x | 9 | 425x | 17 | 103x | 11 | 465x | 5 | 56x |
Fyzikální časopisy
Citace: 2x—4x
- Citováno 4x
Franta, D; Ohlidal, I. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries. Opt. Commun.. 147, 349-358, 10p, ISSN/eISSN: 0030-4018/, (FEB 15 1998) ,WOS:000073389100026 Citováno: 4x
- Citováno 4x
Vrestal, J; Theiner, J; Broz, P; Tomiska, J. Mass-spectrometric determination of the thermodynamic mixing behavior of liquid ternary Fe-Ni-Cr alloys. Thermochim. Acta. 319, 193-200, 8p, ISSN/eISSN: 0040-6031/, (OCT 5 1998) ,WOS:000076523600024 Citováno: 4x
- Citováno 4x
Hala, J. Solvent extraction of europium from aqueous-organic solutions by solvating extractants. J. Radioanal. Nucl. Chem.. 230, 135-141, 7p, ISSN/eISSN: 0236-5731/, (APR 1998) ,WOS:000073463900023 Citováno: 4x
- Citováno 2x
Paseka, J. On some duality for orthoposets. Int. J. Theor. Phys.. 37, 155-161, 7p, ISSN/eISSN: 0020-7748/, (JAN 1998) ,WOS:000072737900021 Citováno: 2x
- Citováno 2x
Vávra, I; Bydzovsky, J; Svec, P; Harvanka, M; Dérer, J; Frait, Z; Kambersky, V; Lopusník, R; Visnovsky, S; Kubena, J; Holy, V. Structural, electrical and magnetic properties of Fe/Si and Fe/FeSi multilayers. Acta Phys. Slovaca. 48, 743-746, 4p, ISSN/eISSN: 0323-0465/, (DEC 1998) ,WOS:000077972000036 Citováno: 2x
- Citováno 2x
Jergel, M; Majkova, E; Luby, S; Senderak, R; Holy, V. Characterization of surfaces and interfaces by hard X-ray reflectometry and diffuse scattering at grazing incidence. Acta Phys. Slovaca. 48, 427-440, 14p, ISSN/eISSN: 0323-0465/, (AUG 1998) ,WOS:000075856700003 Citováno: 2x
- Citováno 2x
Ohlidal, I; Franta, D. Ellipsometry of thin films. Acta Phys. Slovaca. 48, 459-468, 10p, ISSN/eISSN: 0323-0465/, (AUG 1998) ,WOS:000075856700006 Citováno: 2x
- Citováno 2x
Kucirkova, A; Navratil, K; Zemek, J. Depth inhomogeneity of deposited thin films: application to semi-insulating polycrystalline silicon films. Thin Solid Films. 323, 53-58, 6p, ISSN/eISSN: 0040-6090/, (JUN 22 1998) ,WOS:000074746000009 Citováno: 2x
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