Vyberte rok publikace:
1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 všeRok publikace: 2004
Citace článku | Všechny časopisy | Multioborové časopisy | Biologické časopisy | Chemické časopisy | Fyzikální časopisy | Lékařské časopisy | Matematické časopisy | Časopisy Věd o Zemi | Ostatní časopisy
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n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit. | n. čl. | n. cit.
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1000x—99999x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x
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500x—999x | 1 | 706x | 0 | 0x | 0 | 0x | 0 | 0x | 1 | 706x | 0 | 0x | 0 | 0x | 0 | 0x | 0 | 0x
|
200x—499x | 2 | 744x | 0 | 0x | 1 | 247x | 0 | 0x | 0 | 0x | 1 | 247x | 0 | 0x | 1 | 497x | 0 | 0x
|
100x—199x | 11 | 1409x | 1 | 132x | 5 | 679x | 0 | 0x | 4 | 435x | 0 | 0x | 1 | 104x | 1 | 163x | 0 | 0x
|
50x—99x | 44 | 2960x | 0 | 0x | 26 | 1779x | 13 | 913x | 3 | 235x | 3 | 207x | 1 | 69x | 7 | 448x | 1 | 55x
|
20x—49x | 74 | 2277x | 0 | 0x | 32 | 994x | 29 | 892x | 16 | 508x | 8 | 245x | 2 | 53x | 9 | 293x | 1 | 27x
|
10x—19x | 57 | 827x | 0 | 0x | 25 | 360x | 21 | 302x | 9 | 140x | 4 | 51x | 5 | 69x | 6 | 95x | 1 | 14x
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5x—9x | 63 | 428x | 0 | 0x | 22 | 152x | 24 | 166x | 17 | 112x | 9 | 69x | 9 | 61x | 7 | 47x | 3 | 21x
|
2x—4x | 37 | 107x | 0 | 0x | 6 | 19x | 14 | 39x | 15 | 44x | 2 | 6x | 4 | 12x | 0 | 0x | 2 | 7x
|
1x—1x | 13 | 13x | 0 | 0x | 0 | 0x | 9 | 9x | 3 | 3x | 0 | 0x | 1 | 1x | 0 | 0x | 1 | 1x
|
0x—0x | 17 | 0x | 0 | 0x | 2 | 0x | 2 | 0x | 11 | 0x | 1 | 0x | 2 | 0x | 0 | 0x | 0 | 0x
|
Celkem | 319 | 9471x | 1 | 132x | 119 | 4230x | 112 | 2321x | 79 | 2183x | 28 | 825x | 25 | 369x | 31 | 1543x | 9 | 125x |
Fyzikální časopisy
Citace: 10x—19x
- Citováno 18x
Klapetek, P; Ohlídal, I; Bílek, J. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces. Ultramicroscopy. 102, 51-59, 9p, ISSN/eISSN: 0304-3991/1879-2723, (DEC 2004) DOI: https://doi.org/10.1016/j.ultramic.2004.08.005 ,WOS:000225516200007 Citováno: 18x
- Citováno 18x
Chvátalová, K; Houserová, J; Sob, M; Vrest'ál, J. First-principles calculations of energetics of sigma phase formation and thermodynamic modelling in Fe-Ni-Cr system. J. Alloy. Compd.. 378, 71-74, 4p, ISSN/eISSN: 0925-8388/1873-4669, (SEP 22 2004) DOI: https://doi.org/10.1016/j.jallcom.2003.10.071 ,WOS:000223801100011 Citováno: 18x
- Citováno 17x
Sopousek, J; Foret, R; Jan, V. Simulation of dissimilar weld joints of steel P91. Sci. Technol. Weld. Join.. 9, 59-64, 6p, ISSN/eISSN: 1362-1718/1743-2936, (JAN 2004) DOI: https://doi.org/10.1179/136217104225017161 ,WOS:000220786700009 Citováno: 17x
- Citováno 16x
Ohlídal, I; Franta, D; Frumar, M; Jedelesky, J; Omasta, J. Influence of composition, exposure and thermal annealing on optical properties of As-S chalcogenide thin films. J. Optoelectron. Adv. Mater.. 6, 139-148, 10p, ISSN/eISSN: 1454-4164/, (MAR 2004) ,WOS:000220389800017 Citováno: 16x
- Citováno 15x
Mesko, M; Bonaventura, Z; Vasina, P; Tálsky, A; Frgala, Z; Kudrle, V; Janca, J. Electron density measurements in afterglow of high power pulsed microwave discharge. Plasma Sources Sci. Technol.. 13, 562-568, 7p, ISSN/eISSN: 0963-0252/, (NOV 2004) ,WOS:000225421400003 Citováno: 15x
- Citováno 15x
Baufeld, B; Bartsch, M; Broz, P; Schmücker, M. Microstructural changes as postmortem temperature indicator in Ni-Co-Cr-Al-Y oxidation protection coatings. Mater. Sci. Eng. A-Struct. Mater. Prop. Microstruct. Process.. 384, 162-171, 10p, ISSN/eISSN: 0921-5093/, (OCT 25 2004) DOI: https://doi.org/10.1016/j.msea.2004.05.052 ,WOS:000224489300019 Citováno: 15x
- Citováno 14x
Lechner, RT; Schülli, TU; Holy, V; Springholz, G; Stangl, J; Raab, A; Bauer, G; Metzger, TH. Ordering parameters of self-organized three-dimensional quantum-dot lattices determined from anomalous x-ray diffraction. Appl. Phys. Lett.. 84, 885-887, 3p, ISSN/eISSN: 0003-6951/, (FEB 9 2004) DOI: https://doi.org/10.1063/1.1644627 ,WOS:000188763800017 Citováno: 14x
- Citováno 14x
Franta, D; Ohlídal, I; Klapetek, P; Cabarrocas, PRI. Complete characterization of rough polymorphous silicon films by atomic force microscopy and the combined method of spectroscopic ellipsometry and spectroscopic reflectometry. Thin Solid Films. 455, 399-403, 5p, ISSN/eISSN: 0040-6090/, (MAY 1 2004) DOI: https://doi.org/10.1016/j.tsf.2003.11.237 ,WOS:000221690000071 Citováno: 14x
- Citováno 13x
Dubroka, A; Munzar, D. Phonon anomalies in trilayer high-Tc cuprate superconductors. Physica C. 405, 133-147, 15p, ISSN/eISSN: 0921-4534/, (JUN 1 2004) DOI: https://doi.org/10.1016/j.physc.2004.02.001 ,WOS:000221553800006 Citováno: 13x
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