Go to main content | Go to main menu | Go to search

doc. RNDr. Petr Mikulík, Ph.D.

Associate professor, Department of Condensed Matter Physics

Office: pav. 09/02028
Kotlářská 267/2
611 37 Brno

Show on the map

Phone: +420 549 49 5886
E‑mail:
social and academic networks:
Basic information
CV

Curriculum vitae

Person Identification
  • doc. RNDr. Petr Mikulík, Ph.D., born 1969 in Brno
Department/Faculty/University
  • Department of Condensed Matter Physics
    Faculty of Science, Masaryk University
    Kotlářská 2, CZ-611 37 Brno, Czech Republic
Function, current position
  • researcher and teacher
Education and academic qualifications
  • 2009, habilitation, habilitation work Absorption and Diffraction Imaging by Synchrotron Laminography, Diffractometry and Crystal Optics
  • 1997, PhD thesis "under double leadership" in Solid State Physics: X-Ray Reflectivity from Planar and Structured Multilayers. Masaryk University, Brno, Czech Republic and Université Joseph Fourier, Grenoble, France
  • 1992, DEA (equiv. MSc.) in Interaction of Matter and Radiation. Diploma thesis: La caracterisation du systeme epitaxial tungstene/saphir par la diffusion des rayons X. Université Joseph Fourier, Grenoble, France
  • 1992, RNDr./Mgr. (equiv. MSc.) in Solid State Physics. Diploma thesis: Difrakce na kvaziperiodických supermřížkách (Diffraction on Quasiperiodic Superlattices). Masaryk University, Brno, Czech Republic
Professional experience
  • 1997- : Researcher, Department of Condensed Matter Physics, Masaryk University
Teaching activities
  • Physics for chemists
  • Computer science and IT for physicists
  • Physics laboratory
  • Optometry laboratory
  • Laboratory of X-ray structure analysis
  • Clean room laboratory of silicon device technology
Research activities
  • Application of x-ray scattering methods (diffraction, reflection) for thin films, meso- and nanostructures. Simulations and applications of x-ray diffractive-refractive optical devices. Application of x-ray imaging microdiffraction technique "Rocking Curve Imaging" (RCI) for crystalline samples. Application and extension of "Synchrotron Radiation Computed Laminography" (SRCL) method for non-destructive testing of laterally extended samples and devices. Calculations, numerical simulations, experiments.
Professional stays abroad
  • 2001-2002: Fraunhofer Institute for Non-destructive Testing (EADQ), Dresden, Germany
  • 1997/1998: Institute of Semiconductors, Johannes Kepler University, Linz, Austria
  • 1992-1997: CNRS, Laboratoire Louis Néel and ESRF, Grenoble, France (Mgr/DEA and PhD studies under double leadership, half-time shared with Masaryk university)
Other academic activities, research projects, grants
  • Experiments at European synchrotron radiation facilities: ESRF (Grenoble), HASYLAB (Hamburg), ANKA (Karlsruhe).
  • Chief of the clean room laborator for silicon device technology.
  • Research projects: yes.
  • Grants: yes.
Non-university activities
  • Member of the board of the Czech and Slovak Crystallography Association. Head of the Regional Board of Czech and Slovak Crystallographers Delegate of the Czech Republic in the European Synchrotron User Organisation
Major publications
  • NÁDAŽDY, Peter, Jakub HAGARA, Matej JERGEL, Eva MAJKOVÁ, Petr MIKULÍK, Zdenko ZÁPRAŽNÝ, Dusan KORYTÁR a Peter ŠIFFALOVIČ. Exploiting the potential of beam-compressing channel-cut monochromators for laboratory high-resolution small-angle X-ray scattering experiments. Journal of Applied Crystallography. Chester: INT UNION CRYSTALLOGRAPHY, 2019, roč. 52, JUN 2019, s. 498-506. ISSN 0021-8898. Dostupné z: https://dx.doi.org/10.1107/S1600576719003674. URL info
  • FARAGÓ, Tomáš, Petr MIKULÍK, A. ERSHOV, M. VOGELGESANG, D. HANSCHKE a T. BAUMBACH. syris: a flexible and efficient framework for X-ray imaging experiments simulation. Journal of Synchrotron Radiation. CHESTER: INT UNION CRYSTALLOGRAPHY, 2017, roč. 24, November, s. 1283-1295. ISSN 1600-5775. Dostupné z: https://dx.doi.org/10.1107/S1600577517012255. URL info
  • PRAJZLER, V., M. NERUDA, P. NEKVINDOVÁ a Petr MIKULÍK. Properties of Multimode Optical Epoxy Polymer Waveguides Deposited on Silicon and TOPAS Substrate. Radioengineering. PRAHA: SPOLECNOST PRO RADIOELEKTRONICKE INZENYRSTVI, 2017, roč. 26, č. 1, s. 10-15. ISSN 1210-2512. Dostupné z: https://dx.doi.org/10.13164/re.2017.0010. URL info
  • ZÁPRAŽNÝ, Z., D. KORYTÁR, M. JERGEL, P. ŠIFFALOVIČ, E. DOBROČKA, P. VAGOVIČ, C. FERRARI, Petr MIKULÍK, M. DEMYDENKO a M. MIKLOŠKA. Calculations and surface quality measurements of high-asymmetry angle x-ray crystal monochromators for advanced x-ray imaging and metrological applications. Optical Engineering. 2015, roč. 54, č. 3, s. "035101-1"-"035101-12", 12 s. ISSN 0091-3286. Dostupné z: https://dx.doi.org/10.1117/1.OE.54.3.035101. URL info
  • LI, Z.J., A.N. DANILEWSKY, L. HELFEN, Petr MIKULÍK, D. HAENSCHKE, J. WITTGE, D. ALLEN, P. MCNALLY a T. BAUMBACH. Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging. Journal of Synchrotron Radiation. USA: WILEY-BLACKWELL PUBLISHING, 2015, roč. 22, July, s. 1083-1090. ISSN 0909-0495. Dostupné z: https://dx.doi.org/10.1107/S1600577515009650. URL info
  • ZÁPRAŽNÝ, Z., D. KORYTÁR, P. ŠIFFALOVIČ, M. JERGEL, M. DEMYDENKO, Petr MIKULÍK, E. DOBROČKA, C. FERRARI, P. VAGOVIČ a M. MIKLOŠKA. Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications. In C. Morawe, A. Khounsary, and S. Goto. Advances in X-Ray/EUV Optics and Components IX. 9207. vyd. USA: SPIE-INT SOC OPTICAL ENGINEERING, 2014, s. "nestránkováno", 14 s. ISBN 978-1-62841-234-5. Dostupné z: https://dx.doi.org/10.1117/12.2061353. URL info
  • KORYTÁR, D., P. VAGOVIČ, K. VÉGSÖ, P. ŠIFFALOVIČ, E. DOBROČKA, W. JARK, V. ÁČ, Z. ZÁPRAŽNÝ, C. FERRARI, A. CECILIA, E. HAMANN, Petr MIKULÍK, T. BAUMBACH, M. FIEDERLE a M. JERGEL. Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging. Journal of Applied Crystallography. Hoboken: WILEY-BLACKWELL, 2013, roč. 46, č. 4, s. 945-952. ISSN 0021-8898. Dostupné z: https://dx.doi.org/10.1107/S0021889813006122. URL URL info
  • ZÁPRAŽNÝ, Z., D. KORYTÁR, Petr MIKULÍK a V. ÁČ. Processing of projections containing phase contrast in laboratory micro-computerized tomography imaging. Journal of Applied Crystallography. Hoboken: WILEY-BLACKWELL, 2013, roč. 46, Aug, s. 933-938. ISSN 0021-8898. Dostupné z: https://dx.doi.org/10.1107/S002188981300558X. URL info
  • KORYTÁR, D., P. VAGOVIČ, C. FERRARI, P. ŠIFFALOVIČ, M. JERGEL, E. DOBROČKA, Z. ZÁPRAŽNÝ, V. ÁČ a Petr MIKULÍK. Process-induced inhomogeneities in higher asymmetry angle X-ray monochromators. In A. Khounsary, S. Goto, and C. Morawe. Advances in X-Ray/EUV Optics and Components VIII. 8848. vyd. USA: SPIE-INT SOC OPTICAL ENGINEERING, 2013, s. "88480U-1-88480U-8", 8 s. ISBN 978-0-8194-9698-0. Dostupné z: https://dx.doi.org/10.1117/12.2025142. URL info
  • OBERTA, P., J. HRDÝ a Petr MIKULÍK. A proof-of-principle experiment of a novel harmonics separation optics for synchrotron facilities. Journal of Synchrotron Radiation. Hoboken, USA: WILEY-BLACKWELL PUBLISHING, 2012, roč. 19, č. 6, s. 1012-1014. ISSN 0909-0495. Dostupné z: https://dx.doi.org/10.1107/S0909049512036618. URL info
  • HRDÝ, J., Petr MIKULÍK a P. OBERTA. Diffractive-refractive optics: (+,-,-,+) X-ray crystal monochromator with harmonics separation. Journal of Synchrotron Radiation. 2011, roč. 18, č. 1, s. 299-301. ISSN 0909-0495. Dostupné z: https://dx.doi.org/10.1107/S0909049510049204. URL info
  • FERRARI, C., F. GERMINI, D. KORYTÁR, Petr MIKULÍK a L. PEVERINI. X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions. Journal of Applied Crystallography. 2011, roč. 44, č. 44, s. 353-358. ISSN 0021-8898. Dostupné z: https://dx.doi.org/10.1107/S0021889811001439. URL info
  • OBERTA, P., Petr MIKULÍK, M. KITTLER a J. HRDÝ. X-ray collimation by crystals with precise parabolic holes based on diffractive-refractive optics. Journal of Synchrotron Radiation. 2011, roč. 18, č. 1, s. 522-526. ISSN 0909-0495. Dostupné z: https://dx.doi.org/10.1107/S0909049511009083. URL info
  • HELFEN, L., A. MYAGOTIN, Petr MIKULÍK, P. PERNOT, A. VOROPAEV, M. ELYYAN, M. DI MICHIEL, J. BARUCHEL a T. BAUMBACH. On the implementation of computed laminography using synchrotron radiation. Review of Scientific Instruments. Melville (USA): American Institute of Physics, 2011, roč. 82, č. 1, s. "nestrankovano", 8 s. ISSN 0034-6748. URL info
  • VAGOVIČ, P., D. KORYTÁR, Petr MIKULÍK, A. CECILIA, C. FERRARI, Y. YANG, D. HANSCHKE, E. HAMANN, D. PELLICCIA, T.A. LAFFORD, M. FIEDERLE a T. BAUMBACH. In-line Bragg magnifier based on V-shaped germanium crystals. Journal of Synchrotron Radiation. 2011, roč. 18, č. 1, s. 753-760. ISSN 0909-0495. Dostupné z: https://dx.doi.org/10.1107/S090904951102989X. URL info
  • OBERTA, P., Petr MIKULÍK, M. KITTLER, J. HRDÝ a L. PEVERINI. Diffractive-refractive optics: low-aberration Bragg-case focusing by precise parabolic surfaces. Journal of Synchrotron Radiation. 2010, roč. 17, č. 1, s. 36-40. ISSN 0909-0495. URL info
  • KORYTÁR, D., C. FERRARI, Petr MIKULÍK, P. VAGOVIČ, E. DOBROČKA, V. ÁČ, P. KONOPKA, A. ERKO a N. ABROSIMOV. Linearly graded GeSi beam-expanding/compressing X-ray monochromator. Journal of Applied Crystallography. 2010, roč. 2010, č. 43, s. 176-178. ISSN 0021-8898. URL info
  • HOVORKA, Miloš, Filip MIKA, Petr MIKULÍK a Luděk FRANK. Profiling N-Type Dopants in Silicon. Materials Transactions. 2010, roč. 51, č. 2, s. 237-242. ISSN 1345-9678. URL info
  • HUBER, I., Petr MIKULÍK a T. BAUMBACH. Correctness of a particular solution of inverse problem in rocking curve imaging. physica status solidi (a). Wiley, 2009, roč. 208, č. 8, s. 1860-1864. ISSN 1862-6300. URL info
  • BAUMBACH, Tilo a Petr MIKULÍK. X-Ray Reflectivity by Rough Multilayers. In X-Ray and Neutron Reflectivity: Principles and Applications. Berlin: Springer, 2009, s. 235-288. Lecture Notes in Physics: 770. ISBN 978-3-540-88587-0. URL info
  • HOLÝ, Václav, T. BAUMBACH, D. LÜBBERT, L. HELFEN, M. ELLYAN, Petr MIKULÍK, S. KELLER, S.P. DENBAARS a J. SPECK. Diffuse x-ray scattering from statistically inhomogeneous distributions of threading dislocations beyond the ergodic hypothesis. Physical Review B. USA: The American Physical Society, 2008, roč. 77, č. 1, s. 094102-94110. ISSN 1098-0121. URL info
  • KORYTÁR, D., C. FERRARI, Petr MIKULÍK, F. GERMINI, P. VAGOVIČ a T. BAUMBACH. High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors. In Modern Developments in X-Ray and Neutron Optics. Berlin: Springer, 2008, s. 501-512. Springer Series in Optical Sciences 137. ISBN 978-3-540-74560-0. URL info
  • ÁČ, V., P. PERICHTA, D. KORYTÁR a Petr MIKULÍK. Thermal effects under synchrotron radiation power absorption. In Modern Developments in X-Ray and Neutron Optics. Berlín: Springer, 2008, s. 513-524. Springer Series in Optical Sciences 137. ISBN 978-3-540-74560-0. URL info
  • LÜBBERT, D., T. BAUMBACH, Václav HOLÝ, Petr MIKULÍK, L. HELFEN, P. PERNOT, M. ELLYAN, S. KELLER, T.M. KATONA, S.P. DENBAARS a J. SPECK. Microdiffraction imaging of dislocation densities in microstructured samples. Europhysics Letters. Paríž: European Physical Society, 2008, roč. 82, č. 5, s. 56002-56006. ISSN 0295-5075. URL info
  • KULHA, P., A. BOURA, M. HUSÁK, Petr MIKULÍK, Milan KUČERA a Stanislav VALENDA. Design and Fabrication of High-Temperature SOI Strain-Gauges. In 7th International Conference on Advanced Semiconductor Devices and Microsystems. New York: IEEE, 2008, s. 175-178. ISBN 978-1-4244-2325-5. info
  • HELFEN, L., A. MYAGOTIN, A. RACK, P. PERNOT, Petr MIKULÍK, M. DIMICHIEL a T. BAUMBACH. Synchrotron-radiation computed laminography for high-resolution three-dimensional imaging of flat devices. Physica stat.sol.(a). 2007, roč. 204, č. 8, s. 2760-2765. ISSN 0031-8965. URL info
  • VAGOVIČ, P., D. KORYTÁR, Petr MIKULÍK a C. FERRARI. On the design of a monolithic 4-bounce high resolution X-ray monochromator. Nuclear Instruments and Methods in Physics Research Section B. ELSEVIER (NORTH-HOLLAND), 2007, roč. 265, č. 2, s. 599-604. ISSN 0168-583X. URL info
  • HELFEN, L., T. BAUMBACH, D. KIEL, P. PERNOT, Petr MIKULÍK, P. CLOETENS a J. BARUCHEL. Three-dimensional Imaging by Synchrotron Radiation Computed Laminography. ESRF Highlights 2005. Francie: ESRF, 2006, roč. 2006, č. 1, s. 107-108. info
  • LÜBBERT, D., Petr MIKULÍK, P. PERNOT, L. HELFEN, M.D. CRAVEN, S. KELLER, S. DENBAARS a T. BAUMBACH. X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN. Physica stat.sol.(a). 2006, roč. 203, č. 7, s. 1733-1738. ISSN 0031-8965. URL info
  • HELFEN, L., A. MYAGOTIN, P. PERNOT, M. DIMICHIEL, Petr MIKULÍK, A. BERTHOLD a T. BAUMBACH. Investigation of hybrid pixel detector arrays by synchrotron-radiation imaging. Nuclear Instruments & Methods in Physics Research A. 2006, roč. 563, č. 1, s. 163-166. ISSN 0168-9002. URL info
  • MIKULÍK, Petr, D. LÜBBERT, P. PERNOT, L. HELFEN a T. BAUMBACH. Crystallite misorientation analysis in semiconductor wafers and ELO samples by rocking curve imaging. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2006, roč. 253, č. 1, s. 188-193. ISSN 0169-4332. URL info
  • LÜBBERT, D., C. FERRARI, Petr MIKULÍK, P. PERNOT, L. HELFEN, N. VERDI, D. KORYTÁR a T. BAUMBACH. Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging. J. Appl. Crystallography. Velká Britanie: Int. Union of Crystallography, 2005, roč. 38, č. 1, s. 91-96. ISSN 0021-8898. URL info
  • LÜBBERT, D., T. BAUMBACH, Petr MIKULÍK, P. PERNOT, L. HELFEN, R. KÖHLER, T.M. KATONA, S. KELLER, T.M. KATONA a S.P. DENBAARS. Local wing tilt analysis of laterally overgrown GaN by x-ray rocking curve imaging. Journal of physics D: Applied physics. Bristol, England: IOP Publishing Ltd., 2005, roč. 38, 10A, s. A50-A5, 5 s. ISSN 0022-3727. URL info
  • HELFEN, L., T. BAUMBACH, Petr MIKULÍK, D. KIEL, P. PERNOT, P. CLOETENS a J. BARUCHEL. High-resolution three-dimensional imaging of flat objects by synchrotron-radiation computed laminography. Applied Physics Letters. USA: American Institute of Physics, 2005, roč. 86, č. 1, s. 071915-1, 3 s. ISSN 0003-6951. URL info
  • CAHA, Ondřej, Petr MIKULÍK, Jiří NOVÁK, Václav HOLÝ, Simon C. MOSS a Andrew NORMAN. Spontaneous lateral modulation in short-period superlattices investigated by grazing-incidence X-ray diffraction. Physical Review B. USA: American Physical Society, 2005, roč. 72, č. 3, s. 035313-35322. ISSN 1098-0121. info
  • HELFEN, L., F. DEHN, Petr MIKULÍK a T. BAUMBACH. Three-dimensional imaging of cement microstructure evolution during hydration Three-dimensional imaging of cement microstructure evolution during hydration. Advances in Cement Research. London, 2005, roč. 17, č. 3, s. 103-111. ISSN 0951-7197. URL info
  • BAUMBACH, T., L. HELFEN, Petr MIKULÍK a F. DEHN. Synchrotron-radiation X-ray tomography: a method for 3D imaging of cement microstructure and its evolution during hydration. In Proceedings of XIV. International Symposium SANACE 2004. Brno: Sdružení pro sanace betonových konstrukcí, 2004, s. 71-80. ISSN 1211-3700. URL info
  • MIKULÍK, Petr, D. LÜBBERT, D. KORYTÁR, P. PERNOT a T. BAUMBACH. Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2003, roč. 36, č. 1, s. A74-A78, 5 s. ISSN 0022-3727. URL info
  • KORYTÁR, D., Petr MIKULÍK, C. FERRARI, J. HRDÝ, T. BAUMBACH, A. FREUND a Alan KUBĚNA. Two-dimensional x-ray magnification based on a monolithic beam conditioner. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2003, roč. 36, č. 1, s. A65-A68, 4 s. ISSN 0022-3727. URL info
  • MIKULÍK, Petr, M. JERGEL, T. BAUMBACH, E. MAJKOVÁ, E. PINČÍK, Š. LUBY, L. ORTEGA, R. TUCOULOU, P. HUDEK a I. KOSTIČ. Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 2001, roč. 34, 10A, s. A188, 5 s. ISSN 0022-3727. URL info
  • JERGEL, M., Petr MIKULÍK, E. MAJKOVÁ, Š. LUBY, R. SENDERÁK, E. PINČÍK, M. BRUNEL, I. KOSTIČ a A. KONEČNÍKOVÁ. Structural characterization of lamellar multilayer gratings by X-ray reflectivity and scanning electron microscopy. J. Phys. D: Appl. Phys. Velká Britanie: IOP Publishing Ltd, 1999, roč. 32, č. 9999, s. A220, 4 s. ISSN 0022-3727. URL info
  • MIKULÍK, Petr a T. BAUMBACH. X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering. Phys. Rev. B. USA: The American Phys. Society, 1999, roč. 59, č. 11, s. 7632-7643. ISSN 0163-1829. URL info
  • STANGL, J., Václav HOLÝ, Petr MIKULÍK, G. BAUER, I. KEGEL, T.H. METZGER, O.G. SCHMIDT, C. LANGE a K. EBERL. Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering. Applied Physics Letters. USA: American Institute of Physics, 1999, roč. 74, -, s. 3785-3787. ISSN 0003-6951. info
  • LITZMAN, Otto a Petr MIKULÍK. The crystal truncation rod scattering of neutrons and the multiwave dynamical theory of diffraction. J. Phys. Condens. Matter. IOP Publishing Ltd, 1999, roč. 11, č. 30, s. 5767-5779. ISSN 0953-8984. info
  • MIKULÍK, Petr. X-ray reflectivity from planar and structured multilayers : Réflectivité des rayons X par des milticouches planaires et structurées (Souběž.) : Rentgenová reflektivita rovinných a strukturovaných multivrstev (Souběž.). 1997, 151 s. info

2017/09/12

Supervision
Qualifications
Publications
Projects
Teaching

You are running an old browser version. We recommend updating your browser to its latest version.