prof. RNDr. Ivan Ohlídal, DrSc.

1997

• Analysis of single layers placed on slightly rough surfaces by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy

  OHLÍDAL Ivan FRANTA Daniel REZEK Bohuslav OHLÍDAL Miloslav

  Article in Proceedings

  ECASIA 97 - 7th European Conference on Applications of Surface and Interface Analysis, year: 1997

• Optical analysis of weakly absorbing inhomogeneous thin films by means of the envelope method of spectroscopic reflectometry

  OHLÍDAL Ivan NAVRÁTIL Karel

  Article in Periodical

  Jemná mechanika a optika, year: 1997, volume: 42, edition: 3

1996

• Method of shearing interferometry for characterizing non-gaussian randomly rough surfaces

  OHLÍDAL Ivan OHLÍDAL Miloslav FRANTA Daniel MICHÁLEK Aleš

  Article in Proceedings

  Specification, Production, and Testing of Optical Components and Systems, year: 1996

• New Technique of Measurement of Optical Parameters of thin Films

  HLÁVKA Jan OHLÍDAL Ivan VIŽĎA František

  Article in Periodical

  Thin Solid Films, year: 1996, volume: 279

• Plasma Enhanced Chemical Vapour Deposition of Thin Films from Tetraethoxysilane and Methanol: Optical Properties and XPS Analyses

  ZAJÍČKOVÁ Lenka OHLÍDAL Ivan JANČA Jan

  Article in Periodical

  Thin Solid Films, year: 1996, volume: 1996, edition: 280

• Spectroscopic Ellipsometry of Slightly Rough Surfaces Covered by Layers

  OHLÍDAL Ivan FRANTA Daniel HORA Jaroslav

  Article in Proceedings

  ECASIA 95 - 6th European Conference on Applications of Surface and Interface Analysis, year: 1996

• Spektroskopická elipsometrie slabě drsných povrchů

  FRANTA Daniel OHLÍDAL Ivan HORA Jaroslav NAVRÁTIL Karel

  Article in Proceedings

  12. konference českých a slovenských fyziků, year: 1996

1995

• A method of shearing interferometry for determining the statistical quantities of randomly rough surfaces of solids

  OHLÍDAL Miloslav OHLÍDAL Ivan DRUCKMÜLLER Miloslav FRANTA Daniel

  Article in Periodical

  Pure Appl. Opt., year: 1995, volume: 4, edition: 5

• Interferometry of Randomly Rough Surfaces

  OHLÍDAL Miloslav OHLÍDAL Ivan DRUCKMÜLLER Miloslav FRANTA Daniel

  Article in Proceedings

  Photonics '95, year: 1995

• Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries

  OHLÍDAL Ivan VIŽĎA František OHLÍDAL Miloslav

  Article in Periodical

  Optical Engineering, year: 1995, volume: 34, edition: 6